Title :
ENHANCED PROBE CARD FACILITATES AT-SPEED WAFER PROBING IN VERY HIGH DENSITY APPLICATIONS
Author :
Subramanian, Eswar ; Nelson, Randy
Keywords :
Biomembranes; Blades; Capacitance; Crosstalk; Frequency; Impedance; Inductance; Probes; Testing; Wire;
Conference_Titel :
Test Conference, 1992. Proceedings., International
Print_ISBN :
0-7803-0760-7
DOI :
10.1109/TEST.1992.527920
