DocumentCode :
1672979
Title :
Modeling the Impact of Input-to-Output Coupling Capacitance on Power Dissipation Estimation in Deep Submicron CMOS Circuits
Author :
Huang, Zhangcai ; Li, Na ; Huang, Sui ; Inoue, Yasuaki
Author_Institution :
Waseda Univ., Kitakyushu
fYear :
2007
Firstpage :
1154
Lastpage :
1157
Abstract :
In this paper modeling the impact of input-to-output coupling capacitance on power dissipation estimation in submicron CMOS circuits is proposed. Compared with conventional methods, the proposed model is much accurate because it considers the impact of the input-to-output capacitance on power dissipation estimation. In addition, the proposed model can estimate the impact of coupling capacitance on serial gates. The experimental results show that the proposed model can obtain an considerable improvement in accuracy.
Keywords :
CMOS logic circuits; logic gates; input-to-output coupling capacitance; power dissipation estimation; serial gates; submicron CMOS circuits; CMOS digital integrated circuits; Coupling circuits; Microelectronics; Parasitic capacitance; Power dissipation; Power system modeling; Production systems; Semiconductor device modeling; Transient analysis; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Communications, Circuits and Systems, 2007. ICCCAS 2007. International Conference on
Conference_Location :
Kokura
Print_ISBN :
978-1-4244-1473-4
Type :
conf
DOI :
10.1109/ICCCAS.2007.4348251
Filename :
4348251
Link To Document :
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