Title :
Imaging resonant modes in photonic crystal nanocavity by atomic force microscope nano-oxidation
Author :
Chen, W. -Y ; Chen, M. -J ; Cheng, C. -C ; Wang, C. -J ; Chyi, J. -I ; Hsu, T.M.
Author_Institution :
Dept. of Phys., Nat. Central Univ., Jhongli, Taiwan
Abstract :
Electric field distributions of resonant modes in a photonic crystal nanocavity were imaged using atomic force microscope nano-oxidation. A grid pattern of nano-size oxides was grown on the nanocavity to perturb the resonant modes. The perturbation caused a shift in the resonant wavelength that was proportional to the local electric field intensity of the resonant mode. The experimentally obtained field intensity images agreed excellently with the finite-difference time-domain calculations. The measured resonant mode images had high spatial resolution and image contrast, owing to the extremely local perturbation of the atomic force microscope oxidation technique.
Keywords :
atomic force microscopy; finite difference time-domain analysis; nanophotonics; perturbation techniques; atomic force microscope oxidation; electric field distributions; extremely local perturbation; finite-difference time-domain calculations; high spatial resolution; image contrast; imaging resonant modes; nanooxidation; photonic crystal nanocavity; Atomic force microscopy; Cavity resonators; Electric fields; Force; Photonic crystals; Wavelength measurement;
Conference_Titel :
Lasers and Electro-Optics (CLEO), 2012 Conference on
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4673-1839-6