Title :
GMOS Checkers with Testable Bridging and Transistor Stuck-on Faults
Author :
Metra, Cecilia ; Favalli, Michele ; Olivo, Piero ; Riccò, Bruno
Keywords :
Automatic testing; Built-in self-test; CMOS digital integrated circuits; CMOS technology; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Integrated circuit testing; Logic;
Conference_Titel :
Test Conference, 1992. Proceedings., International
Print_ISBN :
0-7803-0760-7
DOI :
10.1109/TEST.1992.527922
