DocumentCode
1673427
Title
3 V operation L-band power double-doped heterojunction FETs
Author
Iwata, N. ; Inosako, K. ; Kuzuhara, M.
Author_Institution
NEC Corp., Shiga, Japan
fYear
1993
Firstpage
1465
Abstract
The microwave power performance of double-doped AlGaAs/InGaAs/GaAs pseudomorphic heterojunction field-effect transistors (HJFETs) operated at a DC drain bias of 3 V is presented. The fabricated 1.1- mu m-gate-length HJFET with an undoped AlGaAs Schottky layer exhibited a maximum drain current of 220 mA/mm, a peak transconductance of 200 mS/mm, and a gate-to-drain breakdown voltage of 21 V. Power performance evaluated at a 3-V drain bias for a 12-mm-gate-periphery device demonstrated a maximum output power of 1.4 W with a 61% power-added efficiency at 950 MHz. The results indicate that the double-doped pseudomorphic HJFETs have a high potential for battery-operated portable power applications.<>
Keywords
III-V semiconductors; aluminium compounds; field effect transistors; gallium arsenide; indium compounds; power transistors; solid-state microwave devices; 1.1 micron; 1.4 W; 21 V; 3 V; 61 percent; 950 MHz; AlGaAs-InGaAs-GaAs; DC drain bias; HJFETs; L-band power double-doped heterojunction FETs; Schottky layer; battery-operated portable power applications; gate-to-drain breakdown voltage; maximum drain current; microwave power performance; peak transconductance; power-added efficiency; Batteries; Current density; FETs; Fabrication; Gallium arsenide; Heterojunctions; Indium gallium arsenide; L-band; Power generation; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 1993., IEEE MTT-S International
Conference_Location
Atlanta, GA, USA
ISSN
0149-645X
Print_ISBN
0-7803-1209-0
Type
conf
DOI
10.1109/MWSYM.1993.276721
Filename
276721
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