• DocumentCode
    1673427
  • Title

    3 V operation L-band power double-doped heterojunction FETs

  • Author

    Iwata, N. ; Inosako, K. ; Kuzuhara, M.

  • Author_Institution
    NEC Corp., Shiga, Japan
  • fYear
    1993
  • Firstpage
    1465
  • Abstract
    The microwave power performance of double-doped AlGaAs/InGaAs/GaAs pseudomorphic heterojunction field-effect transistors (HJFETs) operated at a DC drain bias of 3 V is presented. The fabricated 1.1- mu m-gate-length HJFET with an undoped AlGaAs Schottky layer exhibited a maximum drain current of 220 mA/mm, a peak transconductance of 200 mS/mm, and a gate-to-drain breakdown voltage of 21 V. Power performance evaluated at a 3-V drain bias for a 12-mm-gate-periphery device demonstrated a maximum output power of 1.4 W with a 61% power-added efficiency at 950 MHz. The results indicate that the double-doped pseudomorphic HJFETs have a high potential for battery-operated portable power applications.<>
  • Keywords
    III-V semiconductors; aluminium compounds; field effect transistors; gallium arsenide; indium compounds; power transistors; solid-state microwave devices; 1.1 micron; 1.4 W; 21 V; 3 V; 61 percent; 950 MHz; AlGaAs-InGaAs-GaAs; DC drain bias; HJFETs; L-band power double-doped heterojunction FETs; Schottky layer; battery-operated portable power applications; gate-to-drain breakdown voltage; maximum drain current; microwave power performance; peak transconductance; power-added efficiency; Batteries; Current density; FETs; Fabrication; Gallium arsenide; Heterojunctions; Indium gallium arsenide; L-band; Power generation; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 1993., IEEE MTT-S International
  • Conference_Location
    Atlanta, GA, USA
  • ISSN
    0149-645X
  • Print_ISBN
    0-7803-1209-0
  • Type

    conf

  • DOI
    10.1109/MWSYM.1993.276721
  • Filename
    276721