Title :
MERGING CONCURRENT CHECKING AND OFF-LINE BIST
Author :
Sun, Xiaoling ; Serra, Montse
Keywords :
Built-in self-test; Circuit testing; Costs; Delay; Design for testability; Hardware; Logic testing; Merging; Silicon; Sun;
Conference_Titel :
Test Conference, 1992. Proceedings., International
Print_ISBN :
0-7803-0760-7
DOI :
10.1109/TEST.1992.527923
