DocumentCode

1673462

Title

MERGING CONCURRENT CHECKING AND OFF-LINE BIST

Author

Sun, Xiaoling ; Serra, Montse

fYear

1992

Firstpage

958

Keywords

Built-in self-test; Circuit testing; Costs; Delay; Design for testability; Hardware; Logic testing; Merging; Silicon; Sun;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 1992. Proceedings., International

ISSN

1089-3539

Print_ISBN

0-7803-0760-7

Type

conf

DOI

10.1109/TEST.1992.527923

Filename

527923