Title :
Session 26 overview - SRAM memory
Author :
Shubat, Alexander ; Chung, Jinyong
Keywords :
CMOS technology; Cache memory; Degradation; Logic devices; Paper technology; Power supplies; Random access memory; SRAM chips; Silicon; Voltage;
Conference_Titel :
Solid-State Circuits Conference, 2005. Digest of Technical Papers. ISSCC. 2005 IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
0-7803-8904-2
DOI :
10.1109/ISSCC.2005.1494074
