• DocumentCode
    1673712
  • Title

    An integrated built-in self-testing and self-repair of VLSI/WSI hexagonal arrays

  • Author

    Mazumder, Pinaki

  • fYear
    1995
  • Firstpage
    968
  • Keywords
    Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Logic arrays; Logic testing; Production; Programmable logic arrays; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1992. Proceedings., International
  • Conference_Location
    Baltimore, MD
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-0760-7
  • Type

    conf

  • DOI
    10.1109/TEST.1992.527924
  • Filename
    527924
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1673712