Title :
Characterization and modeling of the substrate noise and its impact on the phase noise of VCO
Author :
Liao, Huailin ; Rustagi, Subhash C. ; Shi, Jinglin ; Xiong, Yong Zhong
Author_Institution :
Inst. of Microelectron., Singapore, Singapore
Abstract :
This paper presents a simple scheme for estimating the digital switching noise at the sensitive RF nodes with the help of a lumped element model for the substrate network. The model parameters have been extracted from the 2-port RF measurements. The efficacy of different isolation schemes such as grounded P+ guard bars and deep N-well has been investigated using phase noise of a VCO as a figure of merit.
Keywords :
CMOS analogue integrated circuits; integrated circuit noise; isolation technology; phase noise; radiofrequency integrated circuits; radiofrequency oscillators; voltage-controlled oscillators; CMOS RFIC; VCO; deep N-well; digital switching noise; figure of merit; grounded P+ guard bar; isolation technology; lumped element model; parameter extraction; phase noise; substrate noise; two-port RF measurement; Bars; CMOS technology; Circuit noise; Circuit testing; Coupling circuits; Noise measurement; Phase noise; Radio frequency; Semiconductor device modeling; Voltage-controlled oscillators;
Conference_Titel :
Radio Frequency Integrated Circuits (RFIC) Symposium, 2003 IEEE
Print_ISBN :
0-7803-7694-3
DOI :
10.1109/RFIC.2003.1213936
