Characterization and modeling of the substrate noise and its impact on the phase noise of VCO

Author

Liao, Huailin ; Rustagi, Subhash C. ; Shi, Jinglin ; Xiong, Yong Zhong

Author_Institution

Inst. of Microelectron., Singapore, Singapore

fYear

2003

Firstpage

247

Lastpage

250

Abstract

This paper presents a simple scheme for estimating the digital switching noise at the sensitive RF nodes with the help of a lumped element model for the substrate network. The model parameters have been extracted from the 2-port RF measurements. The efficacy of different isolation schemes such as grounded P+ guard bars and deep N-well has been investigated using phase noise of a VCO as a figure of merit.

Keywords

CMOS analogue integrated circuits; integrated circuit noise; isolation technology; phase noise; radiofrequency integrated circuits; radiofrequency oscillators; voltage-controlled oscillators; CMOS RFIC; VCO; deep N-well; digital switching noise; figure of merit; grounded P+ guard bar; isolation technology; lumped element model; parameter extraction; phase noise; substrate noise; two-port RF measurement; Bars; CMOS technology; Circuit noise; Circuit testing; Coupling circuits; Noise measurement; Phase noise; Radio frequency; Semiconductor device modeling; Voltage-controlled oscillators;

fLanguage

English

Publisher

ieee

Conference_Titel

Radio Frequency Integrated Circuits (RFIC) Symposium, 2003 IEEE

ISSN

1529-2517

Print_ISBN

0-7803-7694-3

Type

conf

DOI

10.1109/RFIC.2003.1213936

Filename

1213936

Link To Document

https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1673793