Title :
Transitioning military software to commercial use. A case study
Author_Institution :
Rome Lab., RL/ERSR, Rome, NY
Abstract :
Transitioning military technology to commercial applications is an important step toward cutting the costs that have grown from maintaining military specific processes and procedures. Rome Laboratory has accomplished such a transition in an area of system development that has long been identified as high cost and labor intensive. Military standards of the past mandated that detailed tasks and techniques must be applied during the development of military systems to ensure their reliability. Often these mandates came at a high cost and had a severe impact on development schedules. This resulted in a choice between trimming these tasks and losing whatever benefit they may have had or perform the tasks and go into costly budget and schedule overruns. One of the most costly and poorly performed of these tasks was sneak circuit analysis (SCA). A solution to this problem is the automation of the analysis, performing it throughout the design phase of system development, and taking the corrective action before production begins. Rome laboratory has developed such a tool (RL/SCAT, Sneak circuit Analysis Technique), and has transitioned this software out to the commercial world where it has been applied to both military and commercial designs. The RL/SCAT software is currently being marketed by the Phase III Logic Corporation and has been integrated into their schematic capture program CapFast where it can be called on to search for, and identify, sneak circuits. This paper focuses on the software tool development, the successful transition to a commercial vendor, and the current military and commercial applications
Keywords :
circuit analysis computing; circuit reliability; military computing; military standards; software engineering; Phase III Logic Corporation; RL/SCAT software; Rome Laboratory; commercial applications; corrective action; military software; military standards; reliability; reliability tests; schematic level search; sneak circuit analysis; software tool development; Application software; Circuit analysis; Costs; Design automation; Laboratories; Military standards; Performance analysis; Production systems; Scheduling; Software tools;
Conference_Titel :
Aerospace and Electronics Conference, 1997. NAECON 1997., Proceedings of the IEEE 1997 National
Conference_Location :
Dayton, OH
Print_ISBN :
0-7803-3725-5
DOI :
10.1109/NAECON.1997.617771