Title :
Design and on-wafer testing of millimeter-wave external optical modulators
Author :
Polifko, D. ; Matsui, K. ; Ogawa, H.
Author_Institution :
ATR Opt. & Radio Commun. Res. Labs., Kyoto, Japan
Abstract :
Highly accurate computation of the microwave refractive index and impedance of coplanar waveguides on Ti:LiNbO/sub 3/, Mach-Zehnder external optical modulators is performed using the extended spectral domain approach. Narrowband millimeter-wave modulators based on these calculations have been designed, fabricated, and tested with an on-wafer, 0-40-GHz, optical and electrical probe station.<>
Keywords :
electro-optical devices; integrated optics; lithium compounds; microstrip components; modulators; optical modulation; refractive index; titanium; 0 to 40 GHz; LiNbO/sub 3/:Ti; Mach-Zehnder external optical modulators; coplanar waveguides; electrical probe station; extended spectral domain; impedance; microwave refractive index; millimeter-wave external optical modulators; on-wafer testing; optical probe; High performance computing; Impedance; Optical computing; Optical design; Optical modulation; Optical refraction; Optical variables control; Optical waveguides; Refractive index; Testing;
Conference_Titel :
Microwave Symposium Digest, 1993., IEEE MTT-S International
Conference_Location :
Atlanta, GA, USA
Print_ISBN :
0-7803-1209-0
DOI :
10.1109/MWSYM.1993.276738
