DocumentCode
1673916
Title
Design and on-wafer testing of millimeter-wave external optical modulators
Author
Polifko, D. ; Matsui, K. ; Ogawa, H.
Author_Institution
ATR Opt. & Radio Commun. Res. Labs., Kyoto, Japan
fYear
1993
Firstpage
1391
Abstract
Highly accurate computation of the microwave refractive index and impedance of coplanar waveguides on Ti:LiNbO/sub 3/, Mach-Zehnder external optical modulators is performed using the extended spectral domain approach. Narrowband millimeter-wave modulators based on these calculations have been designed, fabricated, and tested with an on-wafer, 0-40-GHz, optical and electrical probe station.<>
Keywords
electro-optical devices; integrated optics; lithium compounds; microstrip components; modulators; optical modulation; refractive index; titanium; 0 to 40 GHz; LiNbO/sub 3/:Ti; Mach-Zehnder external optical modulators; coplanar waveguides; electrical probe station; extended spectral domain; impedance; microwave refractive index; millimeter-wave external optical modulators; on-wafer testing; optical probe; High performance computing; Impedance; Optical computing; Optical design; Optical modulation; Optical refraction; Optical variables control; Optical waveguides; Refractive index; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 1993., IEEE MTT-S International
Conference_Location
Atlanta, GA, USA
ISSN
0149-645X
Print_ISBN
0-7803-1209-0
Type
conf
DOI
10.1109/MWSYM.1993.276738
Filename
276738
Link To Document