• DocumentCode
    1673952
  • Title

    SnO2:Zn2+ ultrathin nanowires with visible-light photocatalytic activity

  • Author

    Zhu, Zonglong ; Liu, Wei ; Xu, Zheng

  • Author_Institution
    Sch. of Chem. & Chem. Eng., Nanjing Univ., Nanjing, China
  • fYear
    2010
  • Firstpage
    876
  • Lastpage
    876
  • Abstract
    Summary form only given. SnO2 and SnO2:Zn2+ ultrathin nanowires (NWs) with diameter of ~5 nm were synthesized in a simple solvothermal method, which were characterized by X-ray diffraction, transmission electron microscopy and infrared spectra. The obtained NWs showed tetragonal phase rutile structure with organic surfactants on their surfaces. UV-visible diffuse reflection spectra of the prepared SnO2:Zn2+ NWs indicated the absorption in the visible region, presumably because of changes in its local environment by the doping of the Zn2+. Their photocatalytic activities are determined by Rhodamine B degradation under visible light irradiation (¿ > 400 nm). It is found that SnO2:Zn2+ NWs performed much higher photocatalytic activities than SnO2 NWs.
  • Keywords
    X-ray diffraction; catalysis; infrared spectra; nanofabrication; nanowires; photochemistry; tin compounds; transmission electron microscopy; ultraviolet spectra; visible spectra; zinc; Rhodamine B degradation; SnO2:Zn; UV-visible diffuse reflection spectra; X-ray diffraction; infrared spectra; local environment; organic surfactants; solvothermal method; tetragonal phase rutile structure; transmission electron microscopy; ultrathin nanowires; visible light irradiation; visible region; visible-light photocatalytic activity; Chemical engineering; Chemistry; Doping; Electromagnetic wave absorption; Heat treatment; Infrared spectra; Nanowires; Optical reflection; Transmission electron microscopy; X-ray diffraction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanoelectronics Conference (INEC), 2010 3rd International
  • Conference_Location
    Hong Kong
  • Print_ISBN
    978-1-4244-3543-2
  • Electronic_ISBN
    978-1-4244-3544-9
  • Type

    conf

  • DOI
    10.1109/INEC.2010.5425157
  • Filename
    5425157