• DocumentCode
    1673981
  • Title

    A novel ROPUF for hardware security

  • Author

    Sahoo, Sauvagya Ranjan ; Kumar, Sudeendra ; Mahapatra, Kamalakanta

  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    Physical Unclonable Functions (PUFs) are promising security primitives in recent times. A PUF is a die-specific random function or silicon biometric that is unique for every instance of the die. PUFs derive their randomness from the uncontrolled random variations in the IC manufacturing process which is used to generate cryptographic keys. Researchers have proposed different kinds of PUF in last decade, with varying properties. Quality of PUF is decided by its properties like: uniqueness, reliability, uniformity etc. In this paper we have designed a novel CMOS based RO PUF with improved quality metrics at the cost of additional hardware. The novel PUF is a modified Ring Oscillator PUF (RO-PUF), in which CMOS inverters of RO-PUF are replaced with Feedthrough logic (FTL) inverters. The FTL inverters in RO-PUF improve the security metrics because of its high leakage current. The use of pulse injection circuit (PIC) is responsible to increase challenge-response pairs (CRP´s). Then a comparison analysis has been carried out by simulating both the PUF in 90 nm technology. The simulation results shows that the proposed modified FTL PUF provides a uniqueness of 45.24% with a reliability of 91.14%.
  • Keywords
    CMOS analogue integrated circuits; copy protection; cryptography; elemental semiconductors; integrated circuit modelling; leakage currents; logic circuits; logic design; logic gates; oscillators; random functions; silicon; CMOS based RO PUF; CMOS inverters; CRP; FTL PUF; FTL inverters; IC manufacturing process; PIC; Si; challenge-response pairs; cryptographic keys; die-specific random function; feedthrough logic inverters; hardware security; leakage current; physical unclonable functions; pulse injection circuit; ring oscillator PUF; security metrics; silicon biometric; size 90 nm; CMOS integrated circuits; Inverters; Leakage currents; Measurement; Reliability; Security; Silicon; Challenge-Response pair (CRP); Feedthrough logic (FTL); Physical Unclonable Function (PUF); Ring Oscillator (RO); process variation (PV);
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design and Test (VDAT), 2015 19th International Symposium on
  • Conference_Location
    Ahmedabad
  • Print_ISBN
    978-1-4799-1742-6
  • Type

    conf

  • DOI
    10.1109/ISVDAT.2015.7208093
  • Filename
    7208093