• DocumentCode
    1674187
  • Title

    AFM as a robot for automated nanohandling

  • Author

    Fatikow, Sergej ; Krohs, Florian ; Bartenwerfer, Malte ; Mick, Uwe ; Niewiera, Florian ; Weigel-Jech, Michael

  • Author_Institution
    Div. Microrobotics & Control Eng., Univ. of Oldenburg, Oldenburg, Germany
  • fYear
    2010
  • Firstpage
    2271
  • Lastpage
    2276
  • Abstract
    Besides its ability of high resolution imaging, the Atomic Force Microscope (AFM) has been recognized as a valuable instrument for manipulation at the nanoscale within the last years. Promising applications of such AFM-based nanorobotic manipulation are e.g. the characterization of nanoentities such as CNTs and DNA or the prototypical fabrication of nanoscale components, devices, and systems based on such nanoobjects. One major problem that arises when the AFM is used as a robot for nanomanipulation is often the relativly low throughput induced by the sequential character of the AFM. Automation has proven to be a suitable means to increase the throughput of such AFM-based nanomanipulations and to achieve more reliable results. This paper discusses the usage of the AFM as a robot for na-nohandling in general and presents our latest results on automated nanomanipulation. The handling of CNTs on HOPG substrate as an example of the manipulation of single nanoentities and our strategies for automated nanohandling are dealt with. Moreover, the feasibility of AFM-based nanostructuring for the development of components for biosensors and the combination of an AFM with an SEM are demonstrated.
  • Keywords
    atomic force microscopy; biosensors; carbon nanotubes; image resolution; micromanipulators; scanning electron microscopy; AFM-based nanorobotic manipulation; AFM-based nanostructuring; HOPG substrate; SEM; atomic force microscope; automated nanohandling; automated nanomanipulation; biosensor; carbon nanotube; high resolution imaging; nanoentity; nanoscale; Automation; DNA; Force; Nanobioscience; Nanoscale devices; Scanning electron microscopy; Atomic Force Microscope (AFM); DNA; biosensors; carbon nanotubes (CNT); nanomanipulation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Control Automation and Systems (ICCAS), 2010 International Conference on
  • Conference_Location
    Gyeonggi-do
  • Print_ISBN
    978-1-4244-7453-0
  • Electronic_ISBN
    978-89-93215-02-1
  • Type

    conf

  • Filename
    5669824