Title :
Reliability evaluation of voltage controlled oscillators based on a device degradation sub-circuit model
Author :
Lin, Wei-Cheng ; Du, Long-Jei ; King, Ya-Chin
Author_Institution :
Dept. of Electr. Eng., Nat. Tsing-Hua Univ., Hsin-Chu, Taiwan
Abstract :
This paper presents a method for circuit reliability evaluation. Based on the study of device reliability, a sub-circuit describing the device degradation after high-voltage stress is proposed. This model allows circuit reliability of VCOs to be evaluated and provides higher degree of freedom for circuit designers.
Keywords :
circuit reliability; voltage-controlled oscillators; circuit reliability; device degradation; device reliability; high-voltage stress; sub-circuit model; voltage controlled oscillator; CMOS technology; Circuit simulation; Degradation; Frequency; Integrated circuit measurements; Leakage current; Semiconductor device modeling; Stress measurement; Voltage; Voltage-controlled oscillators;
Conference_Titel :
Radio Frequency Integrated Circuits (RFIC) Symposium, 2003 IEEE
Print_ISBN :
0-7803-7694-3
DOI :
10.1109/RFIC.2003.1213966
