Title :
Garbage Collection Algorithms for NAND Flash Memory Devices -- An Overview
Author :
Subramani, R. ; Swapnil, H. ; Thakur, Nitin ; Radhakrishnan, B. ; Puttaiah, K.
Author_Institution :
Integrated Eng. Services, Tech Mahindra, Bangalore, India
Abstract :
This paper highlights the necessary garbage collection algorithms which is needed in flash translation layer (FTL) for NAND Flash memory devices such as SATA SSD´s (Solid State Devices). Garbage collection is the process of freeing up partially filled blocks to make room for more data and the Garbage collection (GC) algorithms recommended here plays a key role in maintaining SSD´s Performance and structuring the Flash memory´s long term problems related to Reliability and early wearing out of cells due to repeated overwrites beyond the threshold program limit (P/E cycles). NAND Flash Memories require Garbage Collection (GC) and Wear Leveling (WL) operations to be carried out by Flash Translation Layers (FTLs) that oversee flash management. These Algorithms were implemented to reduce the number of read/write, erase cycles on the pages so that Wear Leveling, Write Amplification and Wear out of the Flash Pages can be reduced.
Keywords :
NAND circuits; flash memories; performance evaluation; storage management; FTL; GC operations; NAND flash memory devices; P-E cycles; SATA SSD; SSD performance; WL operations; flash management; flash memory long term problems; flash memory reliability; flash page wear out; flash page write amplication; flash translation layer; garbage collection algorithms; solid state devices; threshold program limit; wear leveling operations; Flash memories; Memory management; Operating systems; Performance evaluation; Power demand; Solids; FTL; Garbage Collection; HDD; SATA; SSD; TRIM; Wear Leveling; Write Amplification;
Conference_Titel :
Modelling Symposium (EMS), 2013 European
Conference_Location :
Manchester
Print_ISBN :
978-1-4799-2577-3
DOI :
10.1109/EMS.2013.14