Title :
A Framework for Boundary-Scan Based System Test and Diagnosis
Author :
Jarwala, Najmi ; Yau, Chi W. ; Stiling, Paul ; Tammaru, Enn
Keywords :
Automatic testing; Built-in self-test; Control systems; Design for testability; Investments; Maintenance; Packaging; Protocols; Reliability; System testing;
Conference_Titel :
Test Conference, 1992. Proceedings., International
Print_ISBN :
0-7803-0760-7
DOI :
10.1109/TEST.1992.527927
