Title :
Physical-Informatical Essence-Duality-Aware Generic Modeling of Threat Handling Processes
Author :
Mordecai, Yaniv ; Raju, Pathmeswaran ; Chapman, Craig ; Dori, Dov
Author_Institution :
Technion - Israel Inst. of Technol., Haifa, Israel
Abstract :
Systems interact with real world entities, and must hold internal representations of these entities in order to handle them appropriately. Physical-informatical essence duality (PIED) is the parallel existence of the entity as both the original, usually physical source, and its informatical representation, as held by each agent interacting with the entity. The distinction between the original external entity and its representation is critical for correct modeling and realization of complex interactions of cyber-physical systems with the real world. The implications of this distinction must be recognized and accounted for. Conceptual modeling semantics for the PIED problem make this distinction possible, structured, and well-defined in the system model. We review a formalism based on Epistemic Logic semantics, and a model- based framework based on Object Process Methodology, and demonstrate the applicability of our framework for generic modeling of threat handling processes, common to various cyber-physical systems and various types of threats, such as safety hazards, terror attacks, and cyber-attacks.
Keywords :
formal logic; knowledge representation; PIED problem; cyber-physical systems; epistemic logic semantics; informatical representation; model-based framework; object process methodology; physical-informatical essence-duality-aware generic modeling; threat handling process; Adaptation models; Object oriented modeling; Safety; Semantics; Unified modeling language; Visualization; Agent-Oriented Architecture; Cyber-Physical Systems; Epistemic Logic; Knowledge Representation; Model-based Systems Engineering; Object-Process Methodology; Physical- Informatical Essence Duality; Threat Management;
Conference_Titel :
Modelling Symposium (EMS), 2013 European
Conference_Location :
Manchester
Print_ISBN :
978-1-4799-2577-3
DOI :
10.1109/EMS.2013.17