• DocumentCode
    1674750
  • Title

    Thermal management of power electronics modules via acoustic micrography imaging

  • Author

    Haque, Shatil ; Liu, Xingsheng ; Lu, G.-Q. ; Goings, John

  • Author_Institution
    Power Electron. Packaging Lab., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA
  • Volume
    1
  • fYear
    2000
  • fDate
    6/22/1905 12:00:00 AM
  • Firstpage
    299
  • Abstract
    Acoustic micrography imaging is introduced to detect cracks, voids, porosity, coplanarity and delamination at the power module-heat spreader interface. Interfacial defect contents are correlated with measured thermal resistance to establish packaging guidelines for enhanced thermal management of power modules with an optimized bonding process of selected interface materials with minimized defects
  • Keywords
    acoustic imaging; crack detection; delamination; modules; porosity; power electronics; thermal management (packaging); thermal resistance measurement; voids (solid); acoustic micrography imaging; coplanarity detection; cracks detection; delamination detection; enhanced thermal management; interfacial defect contents; optimized bonding process; porosity detection; power electronics modules; power module-heat spreader interface; power modules; selected interface materials; thermal management; thermal resistance measurement; voids detection; Acoustic imaging; Acoustic signal detection; Electronic packaging thermal management; Energy management; Multichip modules; Photomicrography; Power electronics; Thermal management; Thermal management of electronics; Thermal resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applied Power Electronics Conference and Exposition, 2000. APEC 2000. Fifteenth Annual IEEE
  • Conference_Location
    New Orleans, LA
  • Print_ISBN
    0-7803-5864-3
  • Type

    conf

  • DOI
    10.1109/APEC.2000.826119
  • Filename
    826119