• DocumentCode
    1674784
  • Title

    Side channel attack resistant architecture for elliptic curve cryptography

  • Author

    Zode, Pravin ; Deshmukh, Raghavendra B.

  • Author_Institution
    Center for VLSI & Nano Technol., Visvesvaraya Nat. Inst. of Technol., Nagpur, India
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    With the widespread use of applications like internet banking, secured communication, emails, etc. information security is important concern. Security of information depends on implementation of cryptographic algorithm and its complexity to solve in reverse direction. However, with the use of current high speed computational resources it is possible to carry out brute-force attack and various other techniques like analyzing power, temperature, timing information. Therefore, cryptosystems are always under the threat of attacks. Elliptic Curve Cryptography is system based on the theory of elliptic curves. It is very promising technique as it offers better security with shorter key length compared to other contemporary techniques of encryption like AES, RSA etc. It is widely accepted that 160-bit ECC offers equivalent security as of 1024-bit RSA. This feature makes ECC attractive for constrained based devices where less power and storage and computing is required. FPGAs are suitable platform for implementing the cryptosystem as they provides rapid prototyping. However, hardware implementation of crypto algorithm can leak secret information through side channel attacks considerably weakens the system security. Typically, power consumption, timing information, electromagnetic information or inserting faults adversary can analyze the system. The proposed work focuses on to avoid the attacker from gaining the secret information from the system. This is done inserting noise, redundant computations or by false random traces and with focus on tradeoff of VLSI design i.e. Power, Area and Delay.
  • Keywords
    VLSI; public key cryptography; redundancy; ECC; FPGA; RSA redundancy; VLSI design; cryptosystem algorithm; electromagnetic information; elliptic curve cryptography; power consumption; secret information security; side channel attack resistant architecture; timing information; Circuit faults; Elliptic curve cryptography; Hardware; Resistance; Very large scale integration; Elliptic Curve Cryptography; Fault Attack; Power Analysis; Side Channel Attack;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design and Test (VDAT), 2015 19th International Symposium on
  • Conference_Location
    Ahmedabad
  • Print_ISBN
    978-1-4799-1742-6
  • Type

    conf

  • DOI
    10.1109/ISVDAT.2015.7208123
  • Filename
    7208123