• DocumentCode
    1674950
  • Title

    Reliability evaluation for integrated operational amplifiers by means of 1/f noise measurement

  • Author

    Yiqi, Zhuang ; Qing, Sun

  • Author_Institution
    Inst. of Microelectron., Xidian Univ., Xi´´an, China
  • fYear
    1995
  • Firstpage
    428
  • Lastpage
    430
  • Abstract
    It is shown from the accelerated life test and noise measurement that the failure of integrated operational amplifiers due to the drift of IIB or IOS is strongly correlated with 1/f noise in the devices, and the drift is approximately proportional to the initial 1/f noise current. 1/f noise measurement may therefore be applied as a fast and nondestructive tool to predict the long-term instability of operational amplifiers
  • Keywords
    1/f noise; circuit stability; electric noise measurement; integrated circuit measurement; integrated circuit noise; integrated circuit testing; life testing; operational amplifiers; 1/f noise measurement; accelerated life test; current drift; integrated operational amplifiers; long-term instability; noise current; noise measurement; reliability evaluation; Electron devices; Life estimation; Life testing; Low-frequency noise; Noise level; Noise measurement; Nondestructive testing; Operational amplifiers; Performance evaluation; Stress;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State and Integrated Circuit Technology, 1995 4th International Conference on
  • Conference_Location
    Beijing
  • Print_ISBN
    0-7803-3062-5
  • Type

    conf

  • DOI
    10.1109/ICSICT.1995.500186
  • Filename
    500186
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1674950