PDF testability of a combinational circuit derived by covering ROBDD nodes using Invert-And-Or circuits

For high end design, delay test becomes increasingly important. The paper proposes a technique to synthesize fully delay testable circuit without any additional control input. Our proposal is based on covering each ROBDD node by Invert-And-Or elements. We have shown that the generated circuit is fully testable either by robust tests or by validatable non-robust tests.