Title :
Low-leakage architecture for embedded ROM
Author :
Masrani, Mansi S. ; Chilukuri, Raghavendra
Author_Institution :
Post-Graduation & Res. Dept., Nirma Univ., Ahmedabad, India
Abstract :
Register File (RF), Static Random Access Memory (SRAM) and Read Only Memory (ROM) arrays on SoCs comprise over 50% area and consumes substantial power on die. The On die ROM usage is increasing as there is an increased focus on IOTs, multi-core microprocessor for notebooks, 2-in-1s and mobile applications. Achieving high performance at low power specification need considerable innovation. Use of High Threshold Voltage (Vth) devices may not be the solution when targeting high performance designs. Further, as technology scales, leakage increases exponentially, which requires more aggressive low leakage power schemes.
Keywords :
SRAM chips; electrical faults; embedded systems; system-on-chip; IOT; On die ROM usage; ROM arrays; SRAM; SoC; embedded ROM; high threshold voltage devices; low leakage power schemes; mobile applications; multicore microprocessor; read only memory arrays; register file; static random access memory; Computer architecture; Microprocessors; Performance evaluation; Random access memory; Read only memory; Stacking; System-on-chip; Read Only Memory; System-on-Chip; bank; footer; leakage;
Conference_Titel :
VLSI Design and Test (VDAT), 2015 19th International Symposium on
Conference_Location :
Ahmedabad
Print_ISBN :
978-1-4799-1742-6
DOI :
10.1109/ISVDAT.2015.7208151