• DocumentCode
    1675801
  • Title

    Time resolved X-ray studies in semiconductor nanostructures

  • Author

    Jurgilaitis, A. ; Harb, M. ; Enquist, H. ; Nüske, R. ; Persson, A. ; Larsson, J.

  • Author_Institution
    Dept. of Phys., Lund Univ., Lund, Sweden
  • fYear
    2012
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    Time resolved X-ray diffraction has been used to study acoustic oscillations in InAs/Sb nanowires with diameters of 80 nm and 40 nm in order to determine the speed of sound in the wires.
  • Keywords
    X-ray diffraction; acoustic wave velocity; antimony; indium compounds; nanowires; oscillations; semiconductor quantum wires; InAs-Sb; acoustic oscillation; nanowires; semiconductor nanostructure; size 40 nm; size 80 nm; sound speed; time resolved X-ray diffraction; Crystals; Frequency measurement; Nanowires; Phonons; Strain; Vectors; X-ray diffraction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics (CLEO), 2012 Conference on
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    978-1-4673-1839-6
  • Type

    conf

  • Filename
    6326493
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1675801