Title :
Blind bias compensation in speckle imaging
Author :
Bos, Jeremy P. ; Calef, Brandoch ; Williams, Stacie
Author_Institution :
Dept. of Electr. & Comput. Eng., Michigan Technol. Univ., Houghton, MI, USA
Abstract :
We present a method for blind bias compensation of the bispectrum in speckle-imaging applications using EMCCDs. Image reconstructions using this blind method are found to compare favorably with those produced using non-blind methods of bias compensation.
Keywords :
CCD image sensors; image reconstruction; speckle; EMCCD; bispectrum; blind bias compensation method; image reconstructions; speckle imaging; Image reconstruction; Imaging; Photonics; Signal to noise ratio; Speckle; USA Councils;
Conference_Titel :
Lasers and Electro-Optics (CLEO), 2012 Conference on
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4673-1839-6
