Title :
Probabilistic modeling to inverse halftoning based on super resolution
Author :
Saika, Yohei ; Okamoto, Ken ; Matsubara, Fumiya
Abstract :
On the basis of the Bayesian inference using the maximizer of the posterior marginal (MPM) estimate, we formulate the problem of inverse halftoning via the framework of super resolution for the organized dither method. Then, the Monte Carlo simulation for a set of the snapshots of the Q-Ising model clarifies that this method achieves optimal performance under the Bayes-optimal condition and that the Bayes-optimal solution reconstructs more accurately than the MAP estimate. Then, we find that the upper bound of the mean square error is inversely proportional to the number of halftone image in the procedure of inverse halftoning. Then, these results obtained by the Monte Carlo simulations are qualitatively confirmed by the analytical estimate using the infinite-range model. Further, we find that the present method is effective even for realistic images and however that false contour appears in reconstructed images, if we utilize a small number of the halftone images in the procedure of inverse halftoning.
Keywords :
Bayes methods; Monte Carlo methods; image reconstruction; image resolution; inference mechanisms; mean square error methods; Bayes-optimal condition; Bayesian inference; Monte Carlo simulation; Q-Ising model; image reconstruction; infinite-range model; inverse halftoning; maximizer of the posterior marginal estimate; mean square error; organized dither method; probabilistic modeling; super resolution; Analytical models; Arrays; Bayesian methods; Image reconstruction; Image resolution; Monte Carlo methods; Pixel; inverse halftoning; statistical mechanics; super resolution; the Bayesian inference;
Conference_Titel :
Control Automation and Systems (ICCAS), 2010 International Conference on
Conference_Location :
Gyeonggi-do
Print_ISBN :
978-1-4244-7453-0
Electronic_ISBN :
978-89-93215-02-1