Characterization and optimization of electrooptic sampling by volume-integral-method and application of space-harmonic potential

Author

Rottenkolber, M. ; Thomann, W. ; Russer, P.

Author_Institution

Lehrstuhl fur Hochfrequenztechnik, Tech. Univ. Munchen, Germany

fYear

1993

Firstpage

265

Abstract

A method for the calculation of sensitivity and spatial resolution in electrooptic (EO) sampling is described. The method can be applied to an external EO probing tip and to direct probing in EO active substrates. The change in polarization and the resulting intensity variations of the reflected sampling beam after passing through a polarizer are determined using the volume-integral method, which yields a rigorous treatment of the influence of the electrical field and the optical beam. In the case of an external EO probe tip a layered structure with a space-harmonic potential is investigated in detail, and results on sensitivity and spatial resolution are presented.<>

Keywords

electro-optical devices; integral equations; light polarisation; probes; sensitivity analysis; direct probing; electrical field; electro-optic active substrates; electrooptic sampling; external EO probing tip; optical beam; optimization; polarization; reflected sampling beam; sensitivity; space-harmonic potential; spatial resolution; volume-integral-method; Integrated optics; Microwave measurements; Optical beams; Optical polarization; Optical sensors; Planar transmission lines; Power transmission lines; Probes; Sampling methods; Spatial resolution;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Symposium Digest, 1993., IEEE MTT-S International

Conference_Location

Atlanta, GA, USA

ISSN

0149-645X

Print_ISBN

0-7803-1209-0

Type

conf

DOI

10.1109/MWSYM.1993.276827

Filename

276827