Title :
Testability strategy of the Alpha AXP 21164 microprocessor
Author :
Bhavsar, Dilip K. ; Edmondson, John H.
Author_Institution :
Digital Equipment Corp., Hudson, MA, USA
Abstract :
This paper describes the testability strategy and design-for-test features of the Alpha AXP 21164 microprocessor. It discusses the specific testability and manufacturability issues of the chip and the innovative solutions employed to solve them
Keywords :
automatic testing; cache storage; computer architecture; computer testing; design for testability; integrated circuit testing; logic testing; random-access storage; redundancy; Alpha AXP 21164 microprocessor; IEEE 1149.1; design-for-test; embedded RAM test; logic testing; manufacturability; observability; redundant repairable arrays; testability strategy; Automatic testing; CMOS technology; Circuit testing; Costs; Design for testability; Logic; Manufacturing; Microprocessors; Pipelines; Registers;
Conference_Titel :
Test Conference, 1994. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-2103-0
DOI :
10.1109/TEST.1994.527935
