• DocumentCode
    167677
  • Title

    LabVIEW program for the process control of dieletrophoretic assembly of carbon nanotubes

  • Author

    Zixu Han ; Libao An

  • Author_Institution
    Coll. of Mech. Eng., Hebei United Univ., Tangshan, China
  • fYear
    2014
  • fDate
    8-9 May 2014
  • Firstpage
    713
  • Lastpage
    716
  • Abstract
    LabVIEW programs have been widely applied to instrument control for various applications in engineering. In this paper, carbon nanotube (CNT) assembly by dielectrophoresis (DEP) is investigated and LabVIEW is used to control the DEP for increased degree of process automation. Real-time electrode gap impedance is monitored during DEP and is set as feedback control signal to stop the process. A precision LCR meter generates an alternating current (AC) voltage for DEP and simultaneously measures the gap impedance. Through calling some main performance programs in LabVIEW, the LCR meter is initialized and the code can be designed and read into the control programs via the general-purpose interface bus (GPIB) communication. The impedance decreases suddenly when CNTs are deposited across the gap. The control programs contribute significantly to realizing CNT assembly with specific requirements such as with a predefined assembly resistance, a predefined assembly time or a predefined small number of CNTs.
  • Keywords
    assembling; carbon nanotubes; chemical engineering computing; control engineering computing; electrophoresis; field buses; process control; production engineering computing; virtual instrumentation; AC voltage; CNT assembly; GPIB communication; LabVIEW program; alternating current voltage; assembly resistance; assembly time; carbon nanotubes; dielectrophoresis; dieletrophoretic assembly; feedback control signal; gap impedance; general-purpose interface bus; instrument control; precision LCR meter; process automation degree; process control; real-time electrode gap impedance; Assembly; Electrodes; Impedance; Position measurement; Software; Software measurement; Time-frequency analysis; LabVIEW; assembly; carbon nanotubes; dieletrophoresis; process automation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics, Computer and Applications, 2014 IEEE Workshop on
  • Conference_Location
    Ottawa, ON
  • Type

    conf

  • DOI
    10.1109/IWECA.2014.6845721
  • Filename
    6845721