Title :
Calibration of external electron-optic sampling using field simulation and system transfer function analysis
Author :
Wu, X. ; Conn, D. ; Song, J. ; Nickerson, K.
Author_Institution :
Commun. Res. Lab., McMaster Univ., Hamilton, Ont., Canada
Abstract :
A field-based calibration technique for external electro-optic (EO) sampling has been proposed using the system transfer function approach and verified by simulation. The optical simulation incorporating finite-difference-time-domain (FDTD) full wave field analysis is used to predict the optical output in external EO sampling. It is found that distortions can be introduced by probes due to their intrinsic frequency response, which is determined by probe dimensions and materials. It is confirmed that thin probes produce less distortion in picosecond or subpicosecond measurements.<>
Keywords :
MMIC; calibration; digital integrated circuits; electro-optical devices; finite difference time-domain analysis; high-speed optical techniques; integrated circuit testing; microwave measurement; optoelectronic devices; probes; transfer functions; FDTD; distortions; external electron-optic sampling; field simulation; field-based calibration; finite-difference-time-domain; frequency response; full wave field analysis; optical simulation; picosecond measurements; probes; subpicosecond measurements; system transfer function analysis; Analytical models; Calibration; Finite difference methods; Frequency response; Optical distortion; Predictive models; Probes; Sampling methods; Time domain analysis; Transfer functions;
Conference_Titel :
Microwave Symposium Digest, 1993., IEEE MTT-S International
Conference_Location :
Atlanta, GA, USA
Print_ISBN :
0-7803-1209-0
DOI :
10.1109/MWSYM.1993.276838
