Calibration of external electron-optic sampling using field simulation and system transfer function analysis

Author

Wu, X. ; Conn, D. ; Song, J. ; Nickerson, K.

Author_Institution

Commun. Res. Lab., McMaster Univ., Hamilton, Ont., Canada

fYear

1993

Firstpage

221

Abstract

A field-based calibration technique for external electro-optic (EO) sampling has been proposed using the system transfer function approach and verified by simulation. The optical simulation incorporating finite-difference-time-domain (FDTD) full wave field analysis is used to predict the optical output in external EO sampling. It is found that distortions can be introduced by probes due to their intrinsic frequency response, which is determined by probe dimensions and materials. It is confirmed that thin probes produce less distortion in picosecond or subpicosecond measurements.<>

Keywords

MMIC; calibration; digital integrated circuits; electro-optical devices; finite difference time-domain analysis; high-speed optical techniques; integrated circuit testing; microwave measurement; optoelectronic devices; probes; transfer functions; FDTD; distortions; external electron-optic sampling; field simulation; field-based calibration; finite-difference-time-domain; frequency response; full wave field analysis; optical simulation; picosecond measurements; probes; subpicosecond measurements; system transfer function analysis; Analytical models; Calibration; Finite difference methods; Frequency response; Optical distortion; Predictive models; Probes; Sampling methods; Time domain analysis; Transfer functions;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Symposium Digest, 1993., IEEE MTT-S International

Conference_Location

Atlanta, GA, USA

ISSN

0149-645X

Print_ISBN

0-7803-1209-0

Type

conf

DOI

10.1109/MWSYM.1993.276838

Filename

276838