DocumentCode :
1677178
Title :
Full wave characterization of microstrip open end discontinuities patterned on anisotropic substrates using potential theory
Author :
Toncich, S.S. ; Collin, R.E. ; Bhasin, K.B.
Author_Institution :
NASA Lewis Res. Center, Cleveland, OH, USA
fYear :
1993
Firstpage :
1527
Abstract :
A technique for the full-wave characterization of microstrip open end discontinuities fabricated on uniaxial anisotropic substrates using potential theory is presented. The substrate to be analyzed is enclosed in a cut-off waveguide, with the anisotropic axis aligned perpendicular to the air-dielectric interface. A full description of the sources on the microstrip line is included with edge conditions built in. Extension to other discontinuities is discussed. Results for several different anisotropic substrates as a function of microstrip line width are shown.<>
Keywords :
microstrip lines; waveguide theory; cut-off waveguide; edge conditions; full-wave characterization; microstrip line width; microstrip open end discontinuities; potential theory; uniaxial anisotropic substrates; Aerodynamics; Anisotropic magnetoresistance; Dielectric substrates; Loaded waveguides; Microstrip components; Microwave theory and techniques; Physics; Strips; Tensile stress; Waveguide discontinuities;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 1993., IEEE MTT-S International
Conference_Location :
Atlanta, GA, USA
ISSN :
0149-645X
Print_ISBN :
0-7803-1209-0
Type :
conf
DOI :
10.1109/MWSYM.1993.276850
Filename :
276850
Link To Document :
بازگشت