DocumentCode
1677213
Title
Testing high voltage coils
Author
Krolski, Kenneth L.
Author_Institution
Kentron Technol. Inc., USA
fYear
1999
fDate
6/21/1905 12:00:00 AM
Firstpage
289
Lastpage
292
Abstract
This paper discusses the elusive failure mode of high voltage products-dielectric breakdown. Typical measurements, such as, primary-secondary resistance, primary-secondary inductance, turns ratio, etc. are not addressed. Failure mechanisms in high voltage coils originate in the design, winding, assembly, vacuum encapsulation and curing processes. The mechanisms are time and temperature related. In-house testing to sort out potential defects is difficult and time consuming. Reliability must be designed and built into the coil
Keywords
coils; electric breakdown; failure analysis; impulse testing; insulation testing; reliability; winding (process); windings; assembly; curing processes; design; dielectric breakdown; failure mechanisms; failure mode; high-voltage coils testing; reliability design; vacuum encapsulation; winding; Assembly; Breakdown voltage; Coils; Curing; Electrical resistance measurement; Encapsulation; Failure analysis; Inductance measurement; Temperature; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Insulation Conference and Electrical Manufacturing & Coil Winding Conference, 1999. Proceedings
Conference_Location
Cincinnati, OH
ISSN
0362-2479
Print_ISBN
0-7803-5757-4
Type
conf
DOI
10.1109/EEIC.1999.826223
Filename
826223
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