DocumentCode :
1677213
Title :
Testing high voltage coils
Author :
Krolski, Kenneth L.
Author_Institution :
Kentron Technol. Inc., USA
fYear :
1999
fDate :
6/21/1905 12:00:00 AM
Firstpage :
289
Lastpage :
292
Abstract :
This paper discusses the elusive failure mode of high voltage products-dielectric breakdown. Typical measurements, such as, primary-secondary resistance, primary-secondary inductance, turns ratio, etc. are not addressed. Failure mechanisms in high voltage coils originate in the design, winding, assembly, vacuum encapsulation and curing processes. The mechanisms are time and temperature related. In-house testing to sort out potential defects is difficult and time consuming. Reliability must be designed and built into the coil
Keywords :
coils; electric breakdown; failure analysis; impulse testing; insulation testing; reliability; winding (process); windings; assembly; curing processes; design; dielectric breakdown; failure mechanisms; failure mode; high-voltage coils testing; reliability design; vacuum encapsulation; winding; Assembly; Breakdown voltage; Coils; Curing; Electrical resistance measurement; Encapsulation; Failure analysis; Inductance measurement; Temperature; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation Conference and Electrical Manufacturing & Coil Winding Conference, 1999. Proceedings
Conference_Location :
Cincinnati, OH
ISSN :
0362-2479
Print_ISBN :
0-7803-5757-4
Type :
conf
DOI :
10.1109/EEIC.1999.826223
Filename :
826223
Link To Document :
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