DocumentCode
1677644
Title
Validation of a new SPECT quantification method using computer simulation
Author
Liu, YiHwa ; Sinusas, Albert J. ; Wackers, Frans J Th
Author_Institution
Sect. of Cardiovascular Med., Yale Univ. Sch. of Med., New Haven, CT, USA
Volume
3
fYear
1995
Firstpage
1506
Abstract
The authors present a new automated method for SPECT quantification and display, and its validation using computer simulations. The computer simulations provide validation for calculating myocardial defect severity. The short axial slices of the phantoms were divided into four walls (Anterior, Septal, Inferior and Lateral). Simulated myocardial defects with various degrees of severity were created in each wall from apical to basal slices. Twenty-nine computerized phantoms each with twelve SPECT short axial slices were quantified and analyzed using the Yale-CQ (Yale Circumferential Quantification) software. Two dimensional (2D) and three dimensional (3D) quantitative profiles and defect scores from the simulated short axial slices were obtained. The calculated defect score correlated highly with simulated defect severity (R=0.99 both in 2D and 3D). Thus, the quantitative defect score generated with the authors´ SPECT quantification algorithm can be used as a reliable index for detecting severity of myocardial perfusion defect
Keywords
cardiology; digital simulation; medical image processing; single photon emission computed tomography; SPECT quantification method; Yale circumferential quantification software; computerized phantoms; medical diagnostic imaging; myocardial defect severity calculation; nuclear medicine; phantoms; reliable index; short axial slices; simulated myocardial defects; Biomedical imaging; Cardiology; Computational modeling; Computed tomography; Computer displays; Computer simulation; Image resolution; Imaging phantoms; Medical simulation; Myocardium;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium and Medical Imaging Conference Record, 1995., 1995 IEEE
Conference_Location
San Francisco, CA
Print_ISBN
0-7803-3180-X
Type
conf
DOI
10.1109/NSSMIC.1995.500312
Filename
500312
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