• DocumentCode
    1677644
  • Title

    Validation of a new SPECT quantification method using computer simulation

  • Author

    Liu, YiHwa ; Sinusas, Albert J. ; Wackers, Frans J Th

  • Author_Institution
    Sect. of Cardiovascular Med., Yale Univ. Sch. of Med., New Haven, CT, USA
  • Volume
    3
  • fYear
    1995
  • Firstpage
    1506
  • Abstract
    The authors present a new automated method for SPECT quantification and display, and its validation using computer simulations. The computer simulations provide validation for calculating myocardial defect severity. The short axial slices of the phantoms were divided into four walls (Anterior, Septal, Inferior and Lateral). Simulated myocardial defects with various degrees of severity were created in each wall from apical to basal slices. Twenty-nine computerized phantoms each with twelve SPECT short axial slices were quantified and analyzed using the Yale-CQ (Yale Circumferential Quantification) software. Two dimensional (2D) and three dimensional (3D) quantitative profiles and defect scores from the simulated short axial slices were obtained. The calculated defect score correlated highly with simulated defect severity (R=0.99 both in 2D and 3D). Thus, the quantitative defect score generated with the authors´ SPECT quantification algorithm can be used as a reliable index for detecting severity of myocardial perfusion defect
  • Keywords
    cardiology; digital simulation; medical image processing; single photon emission computed tomography; SPECT quantification method; Yale circumferential quantification software; computerized phantoms; medical diagnostic imaging; myocardial defect severity calculation; nuclear medicine; phantoms; reliable index; short axial slices; simulated myocardial defects; Biomedical imaging; Cardiology; Computational modeling; Computed tomography; Computer displays; Computer simulation; Image resolution; Imaging phantoms; Medical simulation; Myocardium;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium and Medical Imaging Conference Record, 1995., 1995 IEEE
  • Conference_Location
    San Francisco, CA
  • Print_ISBN
    0-7803-3180-X
  • Type

    conf

  • DOI
    10.1109/NSSMIC.1995.500312
  • Filename
    500312