• DocumentCode
    1678400
  • Title

    Fast and accurate process-oriented model for CAD of MODFETs

  • Author

    Veresegyhazy, R.K. ; Snowden, C.M.

  • Author_Institution
    Dept. of Electron. & Electr. Eng., Leeds Univ., UK
  • fYear
    1993
  • Firstpage
    1001
  • Abstract
    A fast, quasi-two-dimensional physical MODFET (modulation-doped field-effect transistor) model, capable of accurately simulating single-channel, multichannel, and pseudomorphic MODFETs, has been developed. It has been used to predict DC small-signal and large-signal microwave performance, and it has been applied to microwave and millimeter-wave device and circuit CAD (computer-aided design). The highly efficient physical device model presented allows the DC small-signal and large-signal microwave characteristics of planar and recessed gate HEMTs (high electron mobility transistors) to be obtained based on device geometry and process data. It is easily applied to a wide variety of HEMT structures, including pHEMT, AlGaAs-GaAs, and multichannel structures. This model is particularly useful for optimizing HEMT designs and for use in nonlinear circuit design.<>
  • Keywords
    circuit CAD; high electron mobility transistors; semiconductor device models; solid-state microwave devices; 2D physical model; AlGaAs-GaAs; DC small signal microwave performance; MODFETs; circuit CAD; computer-aided design; device geometry; high electron mobility transistors; large-signal microwave performance; millimeter-wave device; modulation-doped field-effect transistor; multichannel devices; multichannel structures; nonlinear circuit design; planar gate; process data; process-oriented model; pseudomorphic devices; recessed gate HEMTs; single channel devices; Circuit simulation; Computational modeling; Design automation; Epitaxial layers; FETs; HEMTs; MODFET circuits; Microwave circuits; Microwave devices; Millimeter wave devices;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 1993., IEEE MTT-S International
  • Conference_Location
    Atlanta, GA, USA
  • ISSN
    0149-645X
  • Print_ISBN
    0-7803-1209-0
  • Type

    conf

  • DOI
    10.1109/MWSYM.1993.276896
  • Filename
    276896