• DocumentCode
    1678409
  • Title

    A simplified 2D graded mesh FD-TD algorithm for calculating the characteristic impedance of shielded or open planar waveguides with finite metallization thickness

  • Author

    Krupezevic, D.V. ; Brankovic, V.J. ; Arndt, F.

  • Author_Institution
    Microwave Dept., Bremen Univ., Germany
  • fYear
    1993
  • Firstpage
    997
  • Abstract
    A full-wave finite-difference time-domain (FD-TD) algorithm for the efficient calculation of the characteristic impedance of planar waveguiding structures including the finite metallization thickness is described. The FD-TD algorithm is based on a 2D graded mesh combined with adequately formulated absorbing boundary conditions. This allows the inclusion of nearly arbitrarily shaped, fully or partially lateral open or shielded guiding structures with layers of finite metallization thickness. Using a modified formulation, an actual 2D grid for 2D problems is obtained, i.e., the grid size for these problems is zero in the z-direction as long as the waveguide is homogeneous in that direction. The characteristic impedances are calculated by using the related adequate power-voltage or power-current definitions, for structures suitable for the usual types of integrated circuits, such as bilateral finlines, open microstrip lines, lateral open triplate lines, open slotlines, and open coplanar lines.<>
  • Keywords
    electric impedance; fin lines; finite difference time-domain analysis; metallisation; microstrip lines; strip lines; waveguide theory; 2D graded mesh FD-TD algorithm; absorbing boundary conditions; bilateral finlines; characteristic impedance; finite metallization thickness; full-wave FD-TD algorithm; integrated circuits; lateral open triplate lines; open coplanar lines; open microstrip lines; open planar waveguides; open slotlines; shielded guiding structures; Equations; Finite difference methods; Finline; Impedance; Metallization; Microstrip; Planar waveguides; Time domain analysis; Waveguide components; Waveguide theory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 1993., IEEE MTT-S International
  • Conference_Location
    Atlanta, GA, USA
  • ISSN
    0149-645X
  • Print_ISBN
    0-7803-1209-0
  • Type

    conf

  • DOI
    10.1109/MWSYM.1993.276897
  • Filename
    276897