A novel quasi-TEM analysis of valley microstrip lines with slit for use in multilayered MMICs

A novel quasi-TEM (transverse electromagnetic) analysis of valley microstrip lines with slits for use in multilayered MMICs (monolithic microwave integrated circuits) is presented. The characteristic impedance, effective dielectric constant, conductor loss, and dielectric loss are obtained as functions of physical parameters. The present analysis includes: (1) the introduction of fictitious polarization charges, which reduces the original structure into easy-to-tackle valley microstrip lines embedded in stratified media; (2) the construction of an auxiliary rectangular structure and flexible application of the Green´s theorem, which makes it possible to exclude the fictitious charges from the total surface charges over the oblique strip in a simple manner; and (3) the use of the cubic B-spline interpolation, by which the contribution due to the boundary potentials in the auxiliary structure is approximated by a discrete set of potentials.<>