Title :
System-level testability of hardware/software systems
Author :
Vranken, H.P.E. ; Stevens, M.P.J. ; Segers, M.T.M. ; van Rhee, J.H.M.M.
Author_Institution :
Dept. of Electr. Eng., Eindhoven Univ. of Technol., Netherlands
Abstract :
As modern digital hardware/software systems become more complex, the testing of these systems throughout their entire system life cycle, including design verification, production testing, and field testing, becomes a severe problem. In this paper a structured approach is presented to solve the problems of system-level testability. A strategy towards design for system-level testability is introduced, which consists of partitioning the system specification into testable parts, and inserting implementation-independent test functionality in the specification. Incorporating these test requirements in the hardware/software implementation will considerably improve system-level testability. The design and implementation of a traffic-lights control system is presented as an example to illustrate the benefits of this approach
Keywords :
built-in self test; design for testability; electronic equipment testing; production testing; road traffic; traffic control; design for testability; digital hardware/software; field testing; partitioning; production testing; structured approach; system life cycle; system specification; system-level testability; test functionality; traffic-lights control system; verification; Control systems; Digital systems; Electronic equipment testing; Error correction; Hardware; Process design; Production systems; Software systems; Software testing; System testing;
Conference_Titel :
Test Conference, 1994. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-2103-0
DOI :
10.1109/TEST.1994.527945
