DocumentCode
1679319
Title
Evaluating conduction loss of a parallel IGBT-MOSFET combination
Author
Kimball, Jonathan W. ; Chapman, Patrick L.
Author_Institution
Grainger Center for Electr. Machinery & Electromechanics, Illinois Univ., Urbana, IL, USA
Volume
2
fYear
2004
Firstpage
1233
Abstract
A variety of power devices are available to designers, each with specific advantages and limitations. For inverters, typically an IGBT combined with a p-i-n diode is used to obtain high current density. Recent developments in high-voltage MOSFETs support other alternatives. For example, a MOSFET can be paralleled with an IGBT to reduce losses at low currents, while the IGBT carries the load at high currents. The current work evaluates conduction losses in this configuration, showing applicability to generic inverters.
Keywords
MOSFET; insulated gate bipolar transistors; invertors; IGBT; MOSFET; conduction loss; inverters; p-i-n diode; power devices; Diodes; Electric variables measurement; FETs; Insulated gate bipolar transistors; MOSFET circuits; Machinery; Silicon; Temperature; USA Councils; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Industry Applications Conference, 2004. 39th IAS Annual Meeting. Conference Record of the 2004 IEEE
ISSN
0197-2618
Print_ISBN
0-7803-8486-5
Type
conf
DOI
10.1109/IAS.2004.1348570
Filename
1348570
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