• DocumentCode
    1679319
  • Title

    Evaluating conduction loss of a parallel IGBT-MOSFET combination

  • Author

    Kimball, Jonathan W. ; Chapman, Patrick L.

  • Author_Institution
    Grainger Center for Electr. Machinery & Electromechanics, Illinois Univ., Urbana, IL, USA
  • Volume
    2
  • fYear
    2004
  • Firstpage
    1233
  • Abstract
    A variety of power devices are available to designers, each with specific advantages and limitations. For inverters, typically an IGBT combined with a p-i-n diode is used to obtain high current density. Recent developments in high-voltage MOSFETs support other alternatives. For example, a MOSFET can be paralleled with an IGBT to reduce losses at low currents, while the IGBT carries the load at high currents. The current work evaluates conduction losses in this configuration, showing applicability to generic inverters.
  • Keywords
    MOSFET; insulated gate bipolar transistors; invertors; IGBT; MOSFET; conduction loss; inverters; p-i-n diode; power devices; Diodes; Electric variables measurement; FETs; Insulated gate bipolar transistors; MOSFET circuits; Machinery; Silicon; Temperature; USA Councils; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industry Applications Conference, 2004. 39th IAS Annual Meeting. Conference Record of the 2004 IEEE
  • ISSN
    0197-2618
  • Print_ISBN
    0-7803-8486-5
  • Type

    conf

  • DOI
    10.1109/IAS.2004.1348570
  • Filename
    1348570