• DocumentCode
    1679520
  • Title

    Analysis and modeling of electrostatic discharge in a tactile glass featured watch

  • Author

    Germano, Paolo ; Crivii, Mircea ; Demarco, Daniele ; Perriard, Yves ; Paratte, Lionel ; Marquis, Roger

  • Author_Institution
    Lab. of Integrated Actuators, Swiss Fed. Inst. of Technol., Lausanne, Switzerland
  • Volume
    2
  • fYear
    2004
  • Firstpage
    1287
  • Abstract
    Electrostatic discharge (ESD) in quartz watches is becoming more and more important due to the use of plastic materials and tactile sensors. The discharge can lead to different type of dysfunction such as a simple reset, a latch-up or the destruction of the electronics. In this paper, only the reversible dysfunction is considered. Electrostatic finite element (FEM) simulation completed with analytical calculation is carried out. Spatial distribution of the voltages will be shown. Values of the discrete elements are determined either by the electrostatic FEM (capacitors) or by analytical methods. Validation of the theory is done by DC (resistors) and AC (impedance) measurements. The watch is then modeled with these discrete impedances forming a global equivalent circuit in order to simulate its dynamic behavior. Results will show the discharge propagation on key components like the micro-controller IC.
  • Keywords
    electric impedance measurement; electrostatic discharge; equivalent circuits; finite element analysis; tactile sensors; watches; AC measurement; DC measurement; discharge propagation; electrostatic discharge; electrostatic finite element simulation; equivalent circuit; impedance measurement; microcontroller IC; plastic material; quartz watch; resistors measurement; reversible dysfunction; tactile glass featured watch; tactile sensor; Analytical models; Electrostatic analysis; Electrostatic discharge; Finite element methods; Glass; Impedance; Plastics; Tactile sensors; Voltage; Watches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industry Applications Conference, 2004. 39th IAS Annual Meeting. Conference Record of the 2004 IEEE
  • ISSN
    0197-2618
  • Print_ISBN
    0-7803-8486-5
  • Type

    conf

  • DOI
    10.1109/IAS.2004.1348579
  • Filename
    1348579