Title :
Frequency-Based Measurement of Mismatches Between Small Capacitors
Author :
Verma, Ashutosh ; Razavi, Behzad
Author_Institution :
Dept. of Electr. Eng., California Univ., Los Angeles, CA
Abstract :
The mismatch between two capacitors can be measured by alternately switching each into an oscillator and measuring the change in the oscillation frequency. Three-stage differential ring oscillators can provide multiple mismatch data points for capacitances as small as 8 fF. Experimental results obtained from test circuits fabricated in 0.13-mum CMOS technology also reveal lower mismatches for metal sandwich capacitors than for lateral fringe structures
Keywords :
CMOS integrated circuits; capacitors; frequency measurement; oscillators; 0.13 micron; CMOS technology; differential ring oscillators; frequency-based measurement; lateral fringe structures; metal sandwich capacitors; oscillation frequency; small capacitors; CMOS technology; Capacitance measurement; Circuit testing; Electric variables measurement; Frequency measurement; Noise measurement; Oscillators; Semiconductor device noise; Switched capacitor circuits; Voltage;
Conference_Titel :
Custom Integrated Circuits Conference, 2006. CICC '06. IEEE
Conference_Location :
San Jose, CA
Print_ISBN :
1-4244-0075-9
Electronic_ISBN :
1-4244-0076-7
DOI :
10.1109/CICC.2006.320861
