Comparing coax launcher and wafer probe excitation for 10 mil conductor backed CPW with via holes and airbridges

Author

Yu, M. ; Vahldieck, R. ; Huang, J.

Author_Institution

Dept. of Elecr. & Comput. Eng., Victoria Univ., BC, Canada

fYear

1993

Firstpage

705

Abstract

An experimental comparison of coax launchers versus wafer probe excitation of a 10-mil conductor backed CPW (coplanar waveguide) is presented. It was found that conductor backing of a CPW can cause a serious moding problem when a coax launcher is used. Introducing via holes can eliminate this problem to some degree. In comparison, wafer probe excitation generally shows a better response but the back metallization causes some moding problems. The transition effect from the coax launcher onto the CPW was modeled numerically, and good agreement with measured data was found.<>

Keywords

S-parameters; hybrid integrated circuits; metallisation; microstrip components; microstrip lines; microwave integrated circuits; 10 mil; airbridges; back metallization; coax launcher; conductor backed CPW; coplanar waveguide; hybrid MIC; moding problem; transition effect; via holes; wafer probe excitation; Coaxial components; Conductors; Coplanar waveguides; Fixtures; Laboratories; Microwave communication; Microwave integrated circuits; Probes; Semiconductor device modeling; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Symposium Digest, 1993., IEEE MTT-S International

Conference_Location

Atlanta, GA, USA

ISSN

0149-645X

Print_ISBN

0-7803-1209-0

Type

conf

DOI

10.1109/MWSYM.1993.277005

Filename

277005