Title :
A Time-Slicing Ring Oscillator for Capturing Instantaneous Delay Degradation and Power Supply Voltage Drop
Author :
Sato, Takashi ; Matsumoto, Yu ; Hirakimoto, Koji ; Komoda, Michio ; Mano, Junichi
Author_Institution :
Renesas Technol. Corp., Tokyo
Abstract :
A time-slicing ring oscillator (TSRO) which captures dynamic delay degradation due to instantaneous voltage drop on a power supply network is proposed. Voltage drop impact on delay is directly measured and time-domain effective voltage drop waveforms is also obtained. The TSRO consists of standard logic cells only hence fits almost anywhere in logic circuits for in-situ measurements. Measurement results of a test chip using 90-nm process successfully proved its concept
Keywords :
electric potential; logic arrays; oscillators; voltage measurement; 90 nm; dynamic delay degradation; instantaneous delay degradation; power supply voltage drop; standard logic cells; time-domain effective voltage drop waveforms; time-slicing ring oscillator; voltage drop impact; Degradation; Delay effects; Logic circuits; Power supplies; Propagation delay; Ring oscillators; Semiconductor device measurement; Time domain analysis; Voltage; Voltage-controlled oscillators;
Conference_Titel :
Custom Integrated Circuits Conference, 2006. CICC '06. IEEE
Conference_Location :
San Jose, CA
Print_ISBN :
1-4244-0075-9
Electronic_ISBN :
1-4244-0076-7
DOI :
10.1109/CICC.2006.320990
