Title :
Transforming behavioral specifications to facilitate synthesis of testable designs
Author :
Dey, Sujit ; Potkonjak, Miodrag
Author_Institution :
C&C Res. Labs., NEC Res. Inst., Princeton, NJ, USA
Abstract :
Recently, several high level synthesis approaches have been proposed to synthesize testable data paths from behavioral specifications. This paper introduces a novel technique to transform behavioral specifications, such that an existing behavioral test synthesis system can generate area-efficient, testable designs with significantly lower partial scan overhead. Experimental results demonstrate the significant savings in partial scan overhead when the transformation is applied before using the behavioral test synthesis system to synthesize 100% test-efficient designs
Keywords :
automatic testing; boundary scan testing; built-in self test; high level synthesis; logic testing; area-efficient testable design; behavioral specification; behavioral specifications; behavioral test synthesis; high level synthesis; partial scan overhead; savings; synthesis of testable designs; testable data paths; Automatic test pattern generation; Automatic testing; Circuit synthesis; Circuit testing; Flow graphs; Hardware; High level synthesis; Laboratories; System testing; Test pattern generators;
Conference_Titel :
Test Conference, 1994. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-2103-0
DOI :
10.1109/TEST.1994.527949