Title :
A new approach to the microstrip lines with finite strip thickness and conductivity
Author :
Ke, J.-Y. ; Chen, C.H.
Author_Institution :
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
Abstract :
A method is proposed to deal with the microstrip line with layer structure in which the thickness and conductivity of the signal strip are finite. The phase constant beta and attenuation constant alpha of the microstrip line with finite strip thickness and finite conductivity are examined together with the current distributions along the signal strip. The advantage of the CPU time is reflected in the fact that the approach requires 30 s to calculate the phase and attenuation constants per frequency point using the Sun SparcStation 2. The proposed method can be applied to structures with superconductor signal strip and/or semiconductor substrates.<>
Keywords :
MMIC; current distribution; electrical conductivity of solids; electronic engineering computing; microstrip lines; permittivity; waveguide theory; CPU time; MMIC; Sun SparcStation 2; attenuation constant; current distributions; effective dielectric constant; finite conductivity; finite strip thickness; layer structure; microstrip lines; phase constant; semiconductor substrates; superconductor signal strip; Attenuation; Conductivity; Current distribution; Equations; MMICs; Microstrip; Propagation constant; Signal analysis; Strips; Transmission line matrix methods;
Conference_Titel :
Microwave Symposium Digest, 1993., IEEE MTT-S International
Conference_Location :
Atlanta, GA, USA
Print_ISBN :
0-7803-1209-0
DOI :
10.1109/MWSYM.1993.277040
