Title :
An off-chip IDDq current measurement unit for telecommunication ASICs
Author :
Manhaeve, Hans A R ; Wrighton, Paul L. ; Van Sas, Jos ; Swerts, Urbain
Author_Institution :
Dept. of Micro-Electron., KIHWV, Oostende, Belgium
Abstract :
This paper describes the realisation, the operation and the test results of an off-chip IDDq current measurement unit, called OCIMU. The monitor is original in that, if was designed in response to a demand for a circuit that is dedicated to measure the IDDq of telecommunication ASICs. It can be incorporated into a standard ATE during normal engineering and production testing. The monitor is capable of performing at relative high speed (>10 kHz) accurate quiescent current measurements in the 1 μA-1 mA range. The OCIMU circuit does not affect the Device Under Test supply voltage. It provides a stable power supply in the 3 to 7 volt range. Furthermore, the monitor is capable of driving high capacitive loads (>2μF) without speed degradation and to deliver high transient switching currents (up to 10 A). The operation of the OCIMU circuit is based upon the use of the stabilised voltage drop (SVD) principle
Keywords :
CMOS integrated circuits; application specific integrated circuits; automatic test equipment; electric current measurement; integrated circuit testing; production testing; telecommunication equipment testing; 1 muA to 1 mA; 10 A; 10 kHz; 2 muF; IDDq current measurement; capacitive loads; off-chip measurement; production testing; quiescent current measurements; stable power supply; standard ATE; telecommunication ASIC; transient switching currents; Circuit testing; Current measurement; Degradation; Monitoring; Performance evaluation; Power engineering and energy; Power supplies; Production; Switching circuits; Voltage;
Conference_Titel :
Test Conference, 1994. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-2103-0
DOI :
10.1109/TEST.1994.527951
