DocumentCode
1680958
Title
A TOC combining ACO sequencing method for the semiconductor manufacturing fabrication
Author
Li, Li ; Gu, Pan ; Qiao, Fei ; Wu, Ying
Author_Institution
Sch. of Electron. & Inf. Eng., Tongji Univ., Shanghai, China
fYear
2010
Firstpage
4602
Lastpage
4607
Abstract
Based on the analysis on the scheduling characteristics of the semiconductor manufacturing fabrication lines, we propose a TOC(Theory-of-Constraints) combining ACO(Ant Colony Optimization) sequencing method. The method firstly determines the bottlenecks of a semiconductor manufacturing fabrication line, and then applies an ACO algorithm to obtain the optimized jobs processing priority sequence of the bottlenecks, which is the constraint to deduce the jobs processing priority sequence of other non-bottleneck areas. A simplified semiconductor wafer fabrication line model(Mini-fab) is used to verify and validate the proposed method. The simulation results show that the proposed method is superior to the common scheduling rules (such as FIFO, EDD and CR), with the ability to obtain an optimized scheduling solution in a reasonable time.
Keywords
constraint theory; flow production systems; job shop scheduling; optimisation; semiconductor device manufacture; ACO sequencing method; TOC; ant colony optimization; fabrication lines scheduling; jobs processing priority sequence; semiconductor manufacturing fabrication; semiconductor wafer fabrication line; theory-of-constraints; Chromium; Distributed Bragg reflectors; Fabrication; Job shop scheduling; Optimization; Simulation; ACO; TOC; bottlenecks; scheduling; semiconductor manufacturing;
fLanguage
English
Publisher
ieee
Conference_Titel
Intelligent Control and Automation (WCICA), 2010 8th World Congress on
Conference_Location
Jinan
Print_ISBN
978-1-4244-6712-9
Type
conf
DOI
10.1109/WCICA.2010.5554196
Filename
5554196
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