• DocumentCode
    1681171
  • Title

    Two-tone measurement of the nonlinear behavior of a silicon-on-insulator (SOI) ring resonator

  • Author

    Spector, S.J. ; Yegnanarayanan, S. ; Swint, R.B. ; Lyszczarz, T.M. ; Juodawlkis, P.W.

  • Author_Institution
    Lincoln Lab., Massachusetts Inst. of Technol., Lexington, MA, USA
  • fYear
    2012
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    The nonlinearity of a SOI ring resonator was measured using a two-tone method. At frequencies near 10 MHz, 1.5 mW causes significant signal degradation. At frequencies near 1 GHz, little signal degradation is seen.
  • Keywords
    integrated optics; micro-optics; nonlinear optics; optical resonators; optical waveguides; silicon-on-insulator; Si; nonlinear behavior; power 1.5 mW; signal degradation; silicon-on-insulator ring resonator; two-tone measurement; Frequency measurement; Nonlinear optics; Optical attenuators; Optical distortion; Optical ring resonators; Radio frequency; Resonant frequency;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics (CLEO), 2012 Conference on
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    978-1-4673-1839-6
  • Type

    conf

  • Filename
    6326702
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1681171