Title :
Scattering loss in thin, shallow-ridge silion-on-insulator waveguides
Author :
Nguyen, Thach G. ; Tummidi, Ravi S. ; Pafchek, Robert ; Koch, Thomas L. ; Mitchell, Arnan
Author_Institution :
Centre for Ultrahigh-bandwidth Devices for Opt. Syst. (CUDOS), RMIT Univ., Melbourne, VIC, Australia
Abstract :
Roughness induced scattering in thin, shallow-ridge silicon on insulator waveguides is analyzed by coupled mode theory and verified experimentally. Roughness in different waveguide regions causes different scattering natures of TM and TE modes.
Keywords :
light scattering; optical waveguides; silicon-on-insulator; Si; TE modes; TM modes; coupled mode theory; roughness induced scattering; scattering loss; shallow-ridge silicon-on-insulator waveguides; Loss measurement; Optical waveguides; Rough surfaces; Scattering; Slabs; Surface roughness; Surface waves;
Conference_Titel :
Lasers and Electro-Optics (CLEO), 2012 Conference on
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4673-1839-6
