• DocumentCode
    1681320
  • Title

    Scattering loss in thin, shallow-ridge silion-on-insulator waveguides

  • Author

    Nguyen, Thach G. ; Tummidi, Ravi S. ; Pafchek, Robert ; Koch, Thomas L. ; Mitchell, Arnan

  • Author_Institution
    Centre for Ultrahigh-bandwidth Devices for Opt. Syst. (CUDOS), RMIT Univ., Melbourne, VIC, Australia
  • fYear
    2012
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    Roughness induced scattering in thin, shallow-ridge silicon on insulator waveguides is analyzed by coupled mode theory and verified experimentally. Roughness in different waveguide regions causes different scattering natures of TM and TE modes.
  • Keywords
    light scattering; optical waveguides; silicon-on-insulator; Si; TE modes; TM modes; coupled mode theory; roughness induced scattering; scattering loss; shallow-ridge silicon-on-insulator waveguides; Loss measurement; Optical waveguides; Rough surfaces; Scattering; Slabs; Surface roughness; Surface waves;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics (CLEO), 2012 Conference on
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    978-1-4673-1839-6
  • Type

    conf

  • Filename
    6326710
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1681320