• DocumentCode
    1681369
  • Title

    Coupling phenomena in conductor-back slotline structures

  • Author

    Liu, Y. ; Hirota, T. ; Itoh, T.

  • Author_Institution
    Dept. of Electr. Eng., California Univ., Los Angeles, CA, USA
  • fYear
    1993
  • Firstpage
    1203
  • Abstract
    Leakage phenomena possible in conductor-backed slotlines are investigated through an analysis of coupled slotlines for possible application to a nonproximity directional coupler. Two coupled slotlines with finite width of the conductor backing are analyzed using the spectral domain method. The propagation constants and experimental results obtained confirm that coupling is caused by leakage through the conductor backing. It is shown that the slotlines couple with each other even if they are physically separated by a large distance. The coupling phenomena were confirmed through an experiment on forward-coupling directional couplers. It was found possible to prevent the leakage by adding an additional top layer.<>
  • Keywords
    directional couplers; spectral analysis; conductor-back slotline structures; coupled slotlines; forward-coupling directional couplers; leakage; nonproximity directional coupler; propagation constants; spectral domain method; Conductors; Coplanar waveguides; Dielectric constant; Dielectric substrates; Directional couplers; Frequency; Microstrip; Radio communication; Slotline; Strips;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 1993., IEEE MTT-S International
  • Conference_Location
    Atlanta, GA, USA
  • ISSN
    0149-645X
  • Print_ISBN
    0-7803-1209-0
  • Type

    conf

  • DOI
    10.1109/MWSYM.1993.277087
  • Filename
    277087