DocumentCode
1681369
Title
Coupling phenomena in conductor-back slotline structures
Author
Liu, Y. ; Hirota, T. ; Itoh, T.
Author_Institution
Dept. of Electr. Eng., California Univ., Los Angeles, CA, USA
fYear
1993
Firstpage
1203
Abstract
Leakage phenomena possible in conductor-backed slotlines are investigated through an analysis of coupled slotlines for possible application to a nonproximity directional coupler. Two coupled slotlines with finite width of the conductor backing are analyzed using the spectral domain method. The propagation constants and experimental results obtained confirm that coupling is caused by leakage through the conductor backing. It is shown that the slotlines couple with each other even if they are physically separated by a large distance. The coupling phenomena were confirmed through an experiment on forward-coupling directional couplers. It was found possible to prevent the leakage by adding an additional top layer.<>
Keywords
directional couplers; spectral analysis; conductor-back slotline structures; coupled slotlines; forward-coupling directional couplers; leakage; nonproximity directional coupler; propagation constants; spectral domain method; Conductors; Coplanar waveguides; Dielectric constant; Dielectric substrates; Directional couplers; Frequency; Microstrip; Radio communication; Slotline; Strips;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 1993., IEEE MTT-S International
Conference_Location
Atlanta, GA, USA
ISSN
0149-645X
Print_ISBN
0-7803-1209-0
Type
conf
DOI
10.1109/MWSYM.1993.277087
Filename
277087
Link To Document