DocumentCode
1681480
Title
Digital RF Processor Techniques for Single-Chip Radios
Author
Staszewski, Robert Bogdan ; Muhammad, Khurram ; Leipold, Dirk
Author_Institution
Texas Instruments, Dallas, TX
fYear
2006
Firstpage
789
Lastpage
796
Abstract
RF circuits for multi-GHz frequencies have recently migrated to low-cost digital deep-submicron CMOS processes. Unfortunately, this process environment, which is optimized only for digital logic and SRAM memory, is extremely unfriendly for conventional analog and RF designs. We present fundamental techniques recently developed that transform the RF and analog circuit design complexity to digital domain for a wireless RF transceiver, so that it enjoys the benefits of digital approach, such as process node scaling and design automation. All-digital phase locked loop, all-digital control of phase and amplitude of a polar transmitter, and direct RF sampling techniques allow great flexibility in reconfigurable radio design. Digital signal processing concepts are used to help relieve analog design complexity, allowing one to reduce cost and power consumption in a reconfigurable design environment. VHDL hardware description language is universally used throughout this SoC. The ideas presented have been used in Texas Instruments to develop two generations of commercial digital RF processors: a single-chip Bluetooth radio and a single-chip GSM radio
Keywords
CMOS integrated circuits; hardware description languages; microprocessor chips; radio access networks; system-on-chip; transceivers; CMOS processes; SRAM memory; SoC; VHDL hardware description language; all digital phase locked loop; digital RF processor; digital domain; digital logic; multi GHz frequencies; single chip radios; wireless RF transceiver; Analog circuits; CMOS logic circuits; CMOS process; Design automation; Design optimization; Logic design; Radio frequency; Random access memory; Signal design; Transceivers;
fLanguage
English
Publisher
ieee
Conference_Titel
Custom Integrated Circuits Conference, 2006. CICC '06. IEEE
Conference_Location
San Jose, CA
Print_ISBN
1-4244-0075-9
Electronic_ISBN
1-4244-0076-7
Type
conf
DOI
10.1109/CICC.2006.320998
Filename
4115072
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